參數(shù)資料
型號(hào): CY7C1413BV18-250BZXI
廠商: CYPRESS SEMICONDUCTOR CORP
元件分類: SRAM
英文描述: 2M X 18 QDR SRAM, 0.45 ns, PBGA165
封裝: 15 X 17 MM, 1.40 MM HEIGHT, LEAD FREE, M0-216, FBGA-165
文件頁(yè)數(shù): 15/30頁(yè)
文件大小: 726K
代理商: CY7C1413BV18-250BZXI
CY7C1411BV18, CY7C1426BV18
CY7C1413BV18, CY7C1415BV18
Document Number: 001-07037 Rev. *D
Page 22 of 30
Capacitance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
Test Conditions
Max
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz, VDD = 1.8V, VDDQ = 1.5V
5
pF
CCLK
Clock Input Capacitance
4
pF
CO
Output Capacitance
6pF
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
Parameter
Description
Test Conditions
165 FBGA
Package
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
17.2
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
3.2
°C/W
Figure 4. AC Test Loads and Waveforms
1.25V
0.25V
R = 50
Ω
5pF
INCLUDING
JIG AND
SCOPE
ALL INPUT PULSES
Device
RL = 50Ω
Z0 = 50Ω
VREF = 0.75V
0.75V
Under
Test
0.75V
Device
Under
Test
OUTPUT
0.75V
VREF
OUTPUT
ZQ
(a)
Slew Rate = 2 V/ns
RQ =
250
Ω
(b)
RQ =
250
Ω
Note
22. Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250
Ω, V
DDQ = 1.5V, input
pulse levels of 0.25V to 1.25V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of AC Test Loads and Waveforms.
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