參數(shù)資料
型號: LH28F040SUTD-Z4
廠商: Sharp Corporation
英文描述: 4M (512K 】 8) Flash Memory
中文描述: 4分(為512k】8)閃存
文件頁數(shù): 23/32頁
文件大?。?/td> 247K
代理商: LH28F040SUTD-Z4
4M (512K × 8) Flash Memory
LH28F040SUTD-Z4
23
AC Characteristics - Read Only Operations
1
V
CC
= 3.3 V ± 0.3 V, T
A
= -20°C to +70°C
SYMBOL
PARAMETER
MIN.
MAX.
UNITS
NOTE
t
AVAV
Read Cycle Time
150
ns
t
AVGL
Address Setup to OE
Going Low
0
ns
3
t
AVQV
Address to Output Delay
150
ns
t
ELQV
BE
0
, BE
1
to Output Delay
150
ns
2
t
GLQV
OE
to Output Delay
50
ns
2
t
ELQX
BE
0
, BE
1
to Output in Low Z
0
ns
3
t
EHQZ
BE
0
, BE
1
to Output in High Z
55
ns
3
t
GLQX
OE
to Output in Low Z
0
ns
3
t
GHQZ
OE
to Output in High Z
40
ns
3
t
OH
Output Hold from Address, BE
0
, BE
1
or
OE
change, whichever occurs first
0
ns
3
AC Characteristics - Read Only Operations
1
(Continuted)
V
CC
= 2.85 V ± 0.15 V, T
A
= -20°C to +70°C
SYMBOL
PARAMETER
MIN.
MAX.
UNITS
NOTE
t
AVAV
Read Cycle Time
190
ns
t
AVGL
Address Setup to OE
Going Low
0
ns
3
t
AVQV
Address to Output Delay
190
ns
t
ELQV
BE
0
, BE
1
to Output Delay
190
ns
2
t
GLQV
OE
to Output Delay
65
ns
2
t
ELQX
BE
0
, BE
1
to Output in Low Z
0
ns
3
t
EHQZ
BE
0
, BE
1
to Output in High Z
70
ns
3
t
GLQX
OE
to Output in Low Z
0
ns
3
t
GHQZ
OE
to Output in High Z
55
ns
3
t
OH
Output Hold from Address, BE
0
, BE
1
or OE
change, whichever occurs first
0
ns
3
NOTES:
1. See AC Input/Output Reference Waveforms for timing measurements, Figure 4.
2. OE
may be delayed up to t
ELQV
- t
GLQV
after the falling edge of BE
0
, BE
1
without impact on t
ELQV
.
3. Sampled, not 100% tested.
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