參數(shù)資料
型號: SPC5634MF1MMG80
廠商: Freescale Semiconductor
文件頁數(shù): 71/122頁
文件大?。?/td> 0K
描述: IC MCU FLASH 1.5M 94K 208-PBGA
標(biāo)準(zhǔn)包裝: 90
系列: MPC56xx Qorivva
核心處理器: e200z3
芯體尺寸: 32-位
速度: 80MHz
連通性: CAN,EBI/EMI,LIN,SCI,SPI,UART/USART
外圍設(shè)備: DMA,POR,PWM,WDT
輸入/輸出數(shù): 114
程序存儲器容量: 1.5MB(1.5M x 8)
程序存儲器類型: 閃存
RAM 容量: 94K x 8
電壓 - 電源 (Vcc/Vdd): 4.5 V ~ 5.25 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 34x12b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 150°C
封裝/外殼: 208-BGA
包裝: 托盤
MPC5634M Microcontroller Data Sheet, Rev. 9
Pinout and signal description
Freescale Semiconductor
52
CAL_RD_WR
Calibration Bus
RD_WR indicates whether the current transaction is a read
access or a write access.
CAL_TS_ALE
Calibration Bus
The Transfer Start signal (TS) is asserted by the MPC5634M to
indicate the start of a transfer.
The Address Latch Enable (ALE) signal is used to demultiplex
the address from the data bus.
CAL_EVTO
Calibration Bus
Nexus Event Out
CAL_MCKO
Calibration Bus
Nexus Message Clock Out
NEXUSCFG
Nexus/Calibration Bus
Nexus/Calibration Bus selector
eMIOS[0:23]
eMIOS
eMIOS I/O channels
AN[0:39]
eQADC
Single-ended analog inputs for analog-to-digital converter
FCK
eQADC
eQADC free running clock for eQADC SSI.
MA[0:2]
eQADC
These three control bits are output to enable the selection for an
external Analog Mux for expansion channels.
REFBYPC
eQADC
Bypass capacitor input
SDI
eQADC
Serial data in
SDO
eQADC
Serial data out
SDS
eQADC
Serial data select
VRH
eQADC
Voltage reference high input
VRL
eQADC
Voltage reference low input
SCI_A_RX
SCI_B_RX
eSCI_A – eSCI_B
eSCI receive
SCI_A_TX
SCI_B_TX
eSCI_A – eSCI_B
eSCI transmit
ETPU_A[0:31]
eTPU
eTPU I/O channel
CAN_A_TX
CAN_C_TX
FlexCan_A –
FlexCAN_C
FlexCAN transmit
CAN_A_RX
CAN_C_RX
FlexCAN_A –
FlexCAN_C
FlexCAN receive
JCOMP
JTAG
Enables the JTAG TAP controller.
TCK
JTAG
Clock input for the on-chip test and debug logic.
TDI
JTAG
Serial test instruction and data input for the on-chip test and
debug logic.
TDO
JTAG
Serial test data output for the on-chip test logic.
TMS
JTAG
Controls test mode operations for the on-chip test and debug
logic.
Table 4. Signal details (continued)
Signal
Module or Function
Description
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