參數(shù)資料
型號: V30MZ
英文描述: V30MZ(TM) Hardware (Preliminary) | User's Manual[01/2002]
中文描述: V30MZ(TM)硬件(初步)|用戶手冊[01/2002]
文件頁數(shù): 71/89頁
文件大?。?/td> 418K
代理商: V30MZ
71
CHAPTER 8 TEST FUNCTIONS
The V30MZ has unit test functions using the test bus like other CBIC cores.
8.1 Test Pins
The V30MZ has the following test pins.
TBI22 to TBI0
TBO42 to TBO0
BUNRI
TEST
8.1.1 Test bus pins (TBI22 to TBI0, TBO42 to TBO0)
The test bus pins are used instead of normal pins in the unit test mode.
For details, see the Design Manual User's Manual of each cell-based IC Family.
8.1.2 BUNRI, TEST pins
These pins are used to select the normal, unit test, or standby test mode.
Table 8-1. Test Mode Selection List
BUNRI Pin Input Level
TEST Pin Input Level
Mode
Low level
don't care
Normal mode
High level
Low level
Standby test mode
High level
High level
Unit test mode
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