參數(shù)資料
型號: 29F4000
廠商: Macronix International Co., Ltd.
英文描述: 4M-BIT [512Kx8/256Kx16] CMOS FLASH MEMORY
中文描述: 4分位[512Kx8/256Kx16]的CMOS閃存
文件頁數(shù): 22/44頁
文件大小: 710K
代理商: 29F4000
22
P/N:PM0439
MX29F400T/B
REV. 1.6, NOV. 12, 2001
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS
COMMAND WRITE TIMING WAVEFORM
Addresses
CE
OE
WE
DIN
tDS
tAH
Data
tDH
tCS
tCH
tCWC
tCEPH1
tCEP
tOES
tAS
VCC
5V
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
ADD Valid
DEVICE UNDER
TEST
DIODES=IN3064
OR EQUIVALENT
CL
1.2K ohm
1.6K ohm
+5V
CL=100pF Including jig capacitance,
CL=50pF for MX29F400T/B-55
2.0V
2.0V
0.8V
0.8V
TEST POINTS
2.4V
0.45V
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall time are < 20ns.(5ns for MX29F400T/B-55)
Note:VIH/VIL=3.0V/0V, VOH/VOL=1.5V/1.5V, for MX29F400T/B-55.
OUTPUT
INPUT
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