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PC755B/745B
9.4. Connection Recommendations
To ensure reliable operation, it is highly recommended to connect unused inputs to an appropriate signal level through a resistor.
Unused active low inputs should be tied to OVdd. Unused active high inputs should be connected to GND. All NC (no-connect) signals
must remain unconnected.
Power and ground connections must be made to all external Vdd, OVdd, L2OVdd, and GND pins of the PC755B.
9.5. Output Buffer DC Impedance
The PC755B 60x and L2 I/O drivers are characterized over process, voltage, and temperature. To measure Z
0
, an external resistor is
connected from the chip pad to (L2)OVdd or GND. Then, the value of each resistor is varied until the pad voltage is (L2)OVdd/2 (See
Figure 29).
The output impedance is the average of two components, the resistances of the pull-up and pull-down devices. When Data is held
low, SW2 is closed (SW1 is open), and R
N
is trimmed until the voltage at the pad equals (L2)OVdd/2. R
N
then becomes the resistance
of the pull-down devices. When Data is held high, SW1 is closed (SW2 is open), and R
P
is trimmed until the voltage at the pad equals
(L2)OVdd/2. R
P
then becomes the resistance of the pull-up devices.
AUCUN LIEN describes the driver impedance measurement curcuit described above.
(L2)OVdd
OGND
RP
RN
Pad
Data
SW1
SW2
(L2)OVdd
Figure 29 : Driver Impedance Measurement Circuit
Alternately, the following is another method to determine the output impedence of the PC755B. A voltage source, V
force
, is connected
to the output of the PC755B as in Figure 30. Data is held low, the voltage source is set to a value that is equal to (L2)OVdd/2 and the
current sourced by V
force
is measured. The voltage drop across the pulldown device, which is equal to (L2)OVdd/2, is divided by the
measured current to determine the output impedence of the pulldown device, R
N
. Similarly, the impedence of the pullup device is
determined by dividing the voltage drop of the pullup, (L2)OVdd/2, by the current sank by the pullup when the data is high and Vforce is
equal to (L2)OVdd/2. This method can be employed with either empirical data from a test set up or with data from simulation models,
such as IBIS.
R
P
and R
N
are designed to be close to each other in value. Then Z
0
= (R
P
+ R
N
)/2.