參數(shù)資料
型號(hào)： SN54ABT8373
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With Octal D-Type Latches(掃描測(cè)試裝置(帶八D鎖存器))
中文描述： 掃描測(cè)試設(shè)備與八路D類鎖存器（掃描測(cè)試裝置（帶八?鎖存器））
文件頁(yè)數(shù)： 15/19頁(yè)
文件大?。?/td> 391K
代理商： SN54ABT8373
SN54ABT8373, SN74ABT8373
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS487 – JULY 1994
3–15
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 8. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(except I/O ports) (see Note 1)
Input voltage range, V
I
(I/O ports) (see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
Current into any output in the low state, I
O
: SN54ABT8373
–0.5 V to 7 V
–0.5 V to 7 V
–0.5 V to 5.5 V
–0.5 V to 5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . .
96 mA
128 mA
–18 mA
–50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ABT8373
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Storage temperature range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–65
°
C to 150
°
C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
recommended operating conditions (see Note 2)
SN54ABT8373
SN74ABT8373
UNIT
MIN
MAX
MIN
MAX
VCC
VIH
VIL
VI
IOH
IOL
t/
v
TA
NOTE 2: Unused or floating pins (input or I/O) must be held high or low.
Supply voltage
4.5
5.5
4.5
5.5
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
Input voltage
0
VCC
–24
0
VCC
–32
V
High-level output current
mA
Low-level output current
48
64
mA
Input transition rise or fall rate
10
10
ns/V
°
C
Operating free-air temperature
–55
125
–40
85
P
相關(guān)PDF資料
PDF描述
SN74ABT8373 Scan Test Devices With Octal D-Type Latches(掃描測(cè)試裝置(帶八D鎖存器))
SN54ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測(cè)試裝置(帶八D邊沿觸發(fā)器))
SN74ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測(cè)試裝置(帶八D邊沿觸發(fā)器))
SN54ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D鎖存器(三態(tài)輸出))
SN74ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D觸發(fā)器(三態(tài)輸出))
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