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參數(shù)資料
| 型號： | SN54ABT8373 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器)) |
| 中文描述： | 掃描測試設(shè)備與八路D類鎖存器（掃描測試裝置（帶八?鎖存器）） |
| 文件頁數(shù)： | 18/19頁 |
| 文件大小： | 391K |
| 代理商： | SN54ABT8373 |
SN54ABT8373, SN74ABT8373
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS487 – JULY 1994
3–18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
1.5 V
th
tsu
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT FOR OUTPUTS
S1
7 V
Open
GND
500
500
Data Input
Timing Input
1.5 V
3 V
0 V
1.5 V
1.5 V
3 V
0 V
3 V
0 V
1.5 V
1.5 V
tw
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
PULSE DURATION
tPLH
tPHL
tPHL
tPLH
VOH
VOH
VOL
VOL
1.5 V
1.5 V
3 V
0 V
1.5 V
1.5 V
Input
(see Note B)
1.5 V
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note C)
Output
Waveform 2
S1 at Open
(see Note C)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
1.5 V
1.5 V
3.5 V
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
0 V
3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Output
Output
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
7 V
Open
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR
≤
10 MHz, ZO = 50
, tr
≤
2.5 ns, tf
≤
2.5 ns.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. The outputs are measured one at a time with one transition per measurement.
Figure 9. Load Circuit and Voltage Waveforms
P
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