參數(shù)資料
型號: SN54ABT8373
廠商: Texas Instruments, Inc.
英文描述: Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器))
中文描述: 掃描測試設(shè)備與八路D類鎖存器(掃描測試裝置(帶八?鎖存器))
文件頁數(shù): 17/19頁
文件大?。?/td> 391K
代理商: SN54ABT8373
SN54ABT8373, SN74ABT8373
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS487 – JULY 1994
3–17
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Note 3 and Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
SN54ABT8373
SN74ABT8373
UNIT
TYP
MAX
MIN
MAX
MIN
MAX
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
D
Q
2
7
ns
2
7
LE
Q
2
7
ns
2
7
OE
Q
2
8
ns
2
8
OE
Q
2
2
8
8
ns
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Note 3 and Figure 9)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
TA = 25
°
C
MIN
SN54ABT8373
SN74ABT8373
UNIT
TYP
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
TCK
50
90
50
50
MHz
TCK
Q
2
12
ns
2
12
TCK
TDO
2
7
ns
2
7
TCK
Q
2
13
ns
2
13
TCK
TDO
2
7
ns
2
7
TCK
Q
2
14
ns
2
14
TCK
TDO
2
2
9
9
ns
NOTE 3: Product preview specifications are design goals only and are subject to change without notice.
P
相關(guān)PDF資料
PDF描述
SN74ABT8373 Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器))
SN54ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器))
SN74ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器))
SN54ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D鎖存器(三態(tài)輸出))
SN74ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D觸發(fā)器(三態(tài)輸出))
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