參數(shù)資料
型號： SPAKDSP321VL240
廠商： Freescale Semiconductor
文件頁數(shù)： 13/84頁
文件大小： 0K
描述： IC DSP 24BIT 240MHZ 196-MAPBGA
標準包裝： 2
系列： DSP56K/Symphony
類型： 定點
接口： 主機接口，SSI，SCI
時鐘速率： 240MHz
非易失內存： ROM（576 B）
芯片上RAM： 576kB
電壓 - 輸入/輸出： 3.30V
電壓 - 核心： 1.60V
工作溫度： -40°C ~ 100°C
安裝類型： 表面貼裝
封裝/外殼： 196-LBGA
供應商設備封裝： 196-MAPBGA（15x15）
包裝： 托盤
DSP56321 Technical Data, Rev. 11
1-14
Freescale Semiconductor
Signals/Connections
1.11 JTAG and OnCE Interface
The DSP56300 family and in particular the DSP56321 support circuit-board test strategies based on the IEEE
Std. 1149.1 test access port and boundary scan architecture, the industry standard developed under the
sponsorship of the Test Technology Committee of IEEE and the JTAG. The OnCE module provides a means to
interface nonintrusively with the DSP56300 core and its peripherals so that you can examine registers, memory, or
on-chip peripherals. Functions of the OnCE module are provided through the JTAG TAP signals. For programming
models, see the chapter on debugging support in the DSP56300 Family Manual.
Table 1-15.
JTAG/OnCE Interface
Signal
Name
Type
State During
Reset
Signal Description
TCK
Input
Test Clock—A test clock input signal to synchronize the JTAG test logic.
TDI
Input
Test Data Input—A test data serial input signal for test instructions and data.
TDI is sampled on the rising edge of TCK and has an internal pull-up resistor.
TDO
Output
Tri-stated
Test Data Output—A test data serial output signal for test instructions and
data. TDO is actively driven in the shift-IR and shift-DR controller states. TDO
changes on the falling edge of TCK.
TMS
Input
Test Mode Select—Sequences the test controller’s state machine. TMS is
sampled on the rising edge of TCK and has an internal pull-up resistor.
TRST
Input
Test Reset—Initializes the test controller asynchronously. TRST has an
internal pull-up resistor. TRST must be asserted during and after power-up
(see EB610/D for details).
DE
Input/ Output
Input
Debug Event—As an input, initiates Debug mode from an external command
controller, and, as an open-drain output, acknowledges that the chip has
entered Debug mode. As an input, DE causes the DSP56300 core to finish
executing the current instruction, save the instruction pipeline information,
enter Debug mode, and wait for commands to be entered from the debug
serial input line. This signal is asserted as an output for three clock cycles
when the chip enters Debug mode as a result of a debug request or as a result
of meeting a breakpoint condition. The DE has an internal pull-up resistor.
This signal is not a standard part of the JTAG TAP controller. The signal
connects directly to the OnCE module to initiate debug mode directly or to
provide a direct external indication that the chip has entered Debug mode. All
other interface with the OnCE module must occur through the JTAG port.
相關PDF資料
PDF描述
VE-B6R-CY-S CONVERTER MOD DC/DC 7.5V 50W
EMC07DRXS CONN EDGECARD 14POS DIP .100 SLD
ACC35DREH-S734 CONN EDGECARD 70POS .100 EYELET
XC5VLX110-1FFG676C IC FPGA VIRTEX-5 110K 676FBGA
VI-BNB-CY-S CONVERTER MOD DC/DC 95V 50W
相關代理商/技術參數(shù)
參數(shù)描述
SPAKDSP321VL275 功能描述:IC DSP 24BIT 275MHZ 196-MAPBGA RoHS:是 類別:集成電路 (IC) >> 嵌入式 - DSP（數(shù)字式信號處理器） 系列:DSP56K/Symphony 標準包裝:40 系列:TMS320DM64x, DaVinci™ 類型:定點 接口:I²C，McASP，McBSP 時鐘速率:400MHz 非易失內存:外部 芯片上RAM:160kB 電壓 - 輸入/輸出:3.30V 電壓 - 核心:1.20V 工作溫度:0°C ~ 90°C 安裝類型:表面貼裝 封裝/外殼:548-BBGA，F(xiàn)CBGA 供應商設備封裝:548-FCBGA（27x27） 包裝:托盤 配用:TMDSDMK642-0E-ND - DEVELPER KIT W/NTSC CAMERA296-23038-ND - DSP STARTER KIT FOR TMS320C6416296-23059-ND - FLASHBURN PORTING KIT296-23058-ND - EVAL MODULE FOR DM642TMDSDMK642-ND - DEVELOPER KIT W/NTSC CAMERA
SPAKDSP56824BU70 制造商:Freescale Semiconductor 功能描述:
SPAKF56009FJ81 制造商:Motorola Inc 功能描述:
SPAKMC331CFC16 制造商:MOTOROLA 制造商全稱:Motorola, Inc 功能描述:User’s Manual
SPAKMC331CFC20 制造商:MOTOROLA 制造商全稱:Motorola, Inc 功能描述:User’s Manual
發(fā)布緊急采購，3分鐘左右您將得到回復。

采購需求

(若只采購一條型號，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進入我的后臺，查看報價

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進入我的后臺，查看報價

*型號 *數(shù)量 廠商 批號 封裝
添加更多采購

我的聯(lián)系方式

*
*
*