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參數(shù)資料
| 型號(hào)： | PI7C8150BMAE |
| 廠商： | Pericom |
| 文件頁數(shù)： | 3/109頁 |
| 文件大小： | 0K |
| 描述： | IC PCI-PCI BRIDGE ASYNC 208-FQFP |
| 標(biāo)準(zhǔn)包裝： | 24 |
| 系列： | * |
| 應(yīng)用： | * |
| 接口： | * |
| 電源電壓： | * |
| 封裝/外殼： | 208-BFQFP |
| 供應(yīng)商設(shè)備封裝： | 208-FQFP（28x28） |
| 包裝： | 管件 |
| 安裝類型： | 表面貼裝 |
| 產(chǎn)品目錄頁面： | 1227 (CN2011-ZH PDF) |
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PI7C8150B
ASYNCHRONOUS 2-PORT PCI-TO-PCI BRIDGE
ADVANCE INFORMATION
Page 100 of 109
April 2009 – Revision 1.08
16.3
TAP TEST DATA REGISTERS
The PI7C8150B contains two test data registers (bypass and boundary-scan). Each test
data register selected by the TAP controller is connected serially between TDI and TDO.
TDI is connected to the test data register’s most significant bit. TDO is connected to the
least significant bit. Data is shifted one bit position within the register towards TDO on
each rising edge of TCK. While any register is selected, data is transferred from TDI to
TDO without inversion. The following sections describe each of the test data registers.
16.4
BYPASS REGISTER
The required bypass register, a one-bit shift register, provides the shortest path between
TDI and TDO when a bypass instruction is in effect. This allows rapid movement of test
data to and from other components on the board. This path can be selected when no test
operation is being performed on the PI7C8150B.
16.5
BOUNDARY-SCAN REGISTER
The boundary-scan register contains a cell for each pin as well as control cells for I/O and
the high-impedance pin.
Table Table 16-1 shows the bit order of the PI7C8150B boundary-scan register. All table
cells that contain “Control” select the direction of bi-directional pins or high-impedance
output pins. When a “1” is loaded into the control cell, the associated pin(s) are high-
impedance or selected as output.
The boundary-scan register is a required set of serial-shiftable register cells, configured in
master/slave stages and connected between each of the PI7C8150B’s pins and on-chip
system logic. The VDD, GND, and JTAG pins are NOT in the boundary-scan chain.
The boundary-scan register cells are dedicated logic and do not have any system function.
Data may be loaded into the boundary-scan register master cells from
the device input pins and output pin-drivers in parallel by the mandatory SAMPLE and
EXTEST instructions. Parallel loading takes place on the rising edge of TCK.
Data may be scanned into the boundary-scan register serially via the TDI serial input pin,
clocked by the rising edge of TCK. When the required data has been loaded into the
master-cell stages, it can be driven into the system logic at input pins or onto the output
pins on the falling edge of TCK state. Data may also be shifted out of the boundary-scan
register by means of the TDO serial output pin at the falling edge of TCK.
16.6
TAP CONTROLLER
The TAP (Test Access Port) controller is a 4-state synchronous finite state machine that
controls the sequence of test logic operations. The TAP can be controlled via a bus master.
The bus master can be either automatic test equipment or a component (i.e., PLD) that
interfaces to the TAP. The TAP controller changes state only in response to a rising edge of
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| PI7C8150BMAI | 制造商:PERICOM 制造商全稱:Pericom Semiconductor Corporation 功能描述:ASYNCHRONOUS 2-PORT PCI-TO-PCI BRIDGE |
| PI7C8150BMAI-33 | 制造商:PERICOM 制造商全稱:Pericom Semiconductor Corporation 功能描述:ASYNCHRONOUS 2-PORT PCI-TO-PCI BRIDGE |
| PI7C8150BMAIE | 功能描述:外圍驅(qū)動(dòng)器與原件 - PCI 2 Port 32B PCI Bridge RoHS:否 制造商:PLX Technology 工作電源電壓: 最大工作溫度: 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FCBGA-1156 封裝:Tray |
| PI7C8150BMAIE-33 | 功能描述:外圍驅(qū)動(dòng)器與原件 - PCI 2 Port 32B PCI Bridge RoHS:否 制造商:PLX Technology 工作電源電壓: 最大工作溫度: 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FCBGA-1156 封裝:Tray |
| PI7C8150BND | 功能描述:外圍驅(qū)動(dòng)器與原件 - PCI 2-Port 32-Bit PCI Bridge RoHS:否 制造商:PLX Technology 工作電源電壓: 最大工作溫度: 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:FCBGA-1156 封裝:Tray |
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