28F128J3A, 28F640J3A, 28F320J3A
Preliminary
39
5.4
Input Signal Transitions - Reducing Overshoots and
Undershoots When Using Buffers or Transceivers
As faster, high-drive devices such as transceivers or buffers drive input signals to flash memory
devices, overshoots and undershoots can sometimes cause input signals to exceed flash memory
specifications. (See
“
Absolute Maximum Ratings
”
on page 40.) Many buffer/transceiver vendors
now carry bus-interface devices with internal output-damping resistors or reduced-drive outputs.
Internal output-damping resistors diminish the nominal output drive currents, while still leaving
sufficient drive capability for most applications. These internal output-damping resistors help
reduce unnecessary overshoots and undershoots. Transceivers or buffers with balanced- or light-
drive outputs also reduce overshoots and undershoots by diminishing output-drive currents. When
considering a buffer/transceiver interface design to flash, devices with internal output-damping
resistors or reduced-drive outputs should be used to minimize overshoots and undershoots. For
additional information, please refer to the AP-647
5 Volt Intel StrataFlash Memory Design
Guide
.
5.5
V
CC
, V
PEN
, RP# Transitions
Block erase, program, and lock-bit configuration are not guaranteed if V
PEN
or V
CC
falls outside of
the specified operating ranges, or RP#
≠
V
IH
. If RP# transitions to V
IL
during block erase,
program, or lock-bit configuration, STS (in default mode) will remain low for a maximum time of
t
PLPH
+ t
PHRH
until the reset operation is complete. Then, the operation will abort and the device
will enter reset/power-down mode. The aborted operation may leave data partially corrupted after
programming, or partially altered after an erase or lock-bit configuration. Therefore, block erase
and lock-bit configuration commands must be repeated after normal operation is restored. Device
power-off or RP# = V
IL
clears the status register.
The CUI latches commands issued by system software and is not altered by V
PEN
, CE
0
, CE
1
, or
CE
2
transitions, or WSM actions. Its state is read array mode upon power-up, after exit from reset/
power-down mode, or after V
CC
transitions below V
LKO
. V
CC
must be kept at or above V
PEN
during V
CC
transitions.
After block erase, program, or lock-bit configuration, even after V
PEN
transitions down to V
PENLK
,
the CUI must be placed in read array mode via the Read Array command if subsequent access to
the memory array is desired. V
PEN
must be kept at or below V
CC
during V
PEN
transitions.
5.6
Power-Up/Down Protection
The device is designed to offer protection against accidental block erasure, programming, or lock-
bit configuration during power transitions. Internal circuitry resets the CUI to read array mode at
power-up.
A system designer must guard against spurious writes for V
CC
voltages above V
LKO
when V
PEN
is
active. Since WE# must be low and the device enabled (see
Table 2
) for a command write, driving
WE# to V
IH
or disabling the device will inhibit writes. The CUI
’
s two-step command sequence
architecture provides added protection against data alteration.
Keeping V
PEN
below V
PENLK
prevents inadvertent data alteration. In-system block lock and
unlock capability protects the device against inadvertent programming. The device is disabled
while RP# = V
IL
regardless of its control inputs.