Preliminary Data Sheet
February 1997
DSP1628 Digital Signal Processor
Lucent Technologies Inc.
79
8 Device Characteristics
8.1 Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
External leads can be bonded and soldered safely at temperatures of up to 300
°
C..........(TBD for 144-pin PBGA)
Voltage Range on V
DD
with Respect to Ground Using Devices Designed for 3 V Operation..........–0.5 V to +4.6 V
Voltage Range on Any Pin .............................................................................................V
SS
– 0.5 V to V
DD
+ 0.5 V
Power Dissipation................................................................................................................................................1 W
Ambient Temperature Range......................................................................................................... –40
°
C to +85
°
C
Storage Temperature Range
.....................................................................................................................–
65
°
C to +150
°
C
8.2 Handling Precautions
All MOS devices must be handled with certain precautions to avoid damage due to the accumulation of static
charge. Although input protection circuitry has been incorporated into the devices to minimize the effect of this static
buildup, proper precautions should be taken to avoid exposure to electrostatic discharge during handling and mount-
ing. Lucent Technologies employs a human-body model for ESD susceptibility testing. Since the failure voltage of
electronic devices is dependent on the current, voltage, and hence, the resistance and capacitance, it is important
that standard values be employed to establish a reference by which to compare test data. Values of 100 pF and
1500
are the most common and are the values used in the Lucent Technologies human-body model test circuit.
The breakdown voltage for the DSP1628 is greater than 2000 V.
8.3 Recommended Operating Conditions
The ratio of the instruction cycle rate to the input clock frequency is 1:1 without the PLL (referred to as 1X operation)
and M/(2N) with the PLL selected (see Section 4.13). Device speeds greater than 50 MIPS do not support 1X
operation; use the PLL.
Table 64. Recommended Operating Conditions
Maximum
Instruction Rate
(MIPS)
52
Device
Speed
Input Clock
Package
Supply Voltage
V
DD
(V)
Min
2.7
Ambient Tem-
perature T
A
(
°
C)
Min
–40
Max
3.3
Max
85
19.2 ns
CMOS, small-signal
PBGA
BQFP
or TQFP
PBGA
BQFP
or TQFP
80
12.5 ns
CMOS, small-signal
2.7
3.3
–40
85