參數(shù)資料
型號: GS4576S09L-25
廠商: GSI TECHNOLOGY
元件分類: DRAM
英文描述: DDR DRAM, PBGA144
封裝: UBGA-144
文件頁數(shù): 57/64頁
文件大?。?/td> 2691K
代理商: GS4576S09L-25
TAP DC Electrical Characteristics and Operating Conditions
Description
Condition
Symbol
Min
Max
Units
Notes
Input High (logic 1) Voltage
VIH
VREF + 0.15
VDD + 0.3
V
1, 2
Input High (logic 0) Voltage
VIL
VSSQ – 0.3
VREF – 0.15
V
1, 2
Input Leakage Current
Output disabled,
0 V
≤ VIN ≤ VDDQ
ILI
–5.0
5.0
μΑ
Output Leakage Current
0 V
≤ VIN ≤ VDD
ILO
–5.0
5.0
μΑ
Output Low Voltage
IOLC = 100 μΑ
VOL1
0.2
V
1
Output Low Voltage
IOLT = 2mA
VOL2
0.4
V
1
Output High Voltage
IOHC = 100 μΑ
VOH1
VDDQ – 0.2
V
1
Output High Voltage
IOHT= 2mA
VOH2
VDDQ – 0.4
V
1
Notes:
1. All voltages referenced to VSS (GND).
2. Overshoot = VIH(AC) ≤ VDD + 0.7 V for t ≤ tTHTH/2; undershoot = VIL(AC) ≥ – 0.5 V for t ≤ tTHTH/2; during normal operation, VDDQ must
not exceed VDD.
Scan Register Sizes
Register Name
Bit Size
Instruction
8
Bypass
1
ID
32
Boundary Scan
113
JTAG TAP Instruction Codes
Instruction
Code
Description
EXTEST
0000 0000
Captures I/O ring contents; Places the Boundary Scan Register betwen TDI and TDO; This
operation does not affect LLDRAM II operations.
IDCODE
0010 0001
Loads the ID register with the vendor ID code and places the register between TDI and TDO; This
operation does not affect LLDRAM II operations.
SAMPLE/PRELOAD
0000 0101
Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO.
CLAMP
0000 0111
Selects the bypass register to be connected between TDI and TDO; Data driven by output balls are
determined from values held in the Boundary Scan Register.
HIGH-Z
0000 0011
Selects the bypass register to be connected between TDI and TDO; All outputs are forced into
High-Z.
BYPASS
1111 1111
Places Bypass Register between TDI and TDO.This operation does not affect LLDRAM II
operations.
Preliminary
GS4576S09/18L
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.01 4/2011
60/64
2011, GSI Technology
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