參數(shù)資料
型號: AD6635BB
廠商: ANALOG DEVICES INC
元件分類: 無繩電話/電話
英文描述: 4-Channel, 80 MSPS WCDMA Receive Signal Processor (RSP)
中文描述: TELECOM, CELLULAR, BASEBAND CIRCUIT, PBGA324
封裝: 19 X 19 MM, PLASTIC, BGA-324
文件頁數(shù): 35/60頁
文件大?。?/td> 799K
代理商: AD6635BB
REV. 0
AD6635
–35–
Figure 32 (Block Diagram of the AGC), and the operation is
similar to the Desired Signal Level mode.
First, the data from the gain multiplier is truncated to a lower
resolution (4, 5, 6, 7, 8, 10, 12, or 16 bits) as set by the AGC
control word. An error term (both I and Q) is generated that is
the difference between the signals before and after truncation.
This term is passed to the complex squared magnitude block for
averaging and decimating the update samples and taking their
square root to find rms samples, just as in Desired Signal
Level mode. In place of the request desired signal level, a
desired clipping level is subtracted, leaving an error term to be
processed by the second-order loop filter. The rest of the loop
operates the same way as the Desired Signal Level mode. This
way the truncation error is calculated and the AGC loop oper-
ates to maintain a constant truncation error level.
Apart from Bit 4 of the AGC control words, the only other
register setting change, compared to the Desired Signal Level
mode, is that the Desired Clipping level is stored in the AGC
Desired Level registers (0x0C, 0x15) instead of the Request
Signal Level (as in Desired Signal Level mode).
Synchronization
In scenarios where AGC output is connected to a RAKE receiver,
the RAKE receiver can synchronize the average and update sec-
tion to update the average power for AGC error calculation and
loop filtering. This external sync signal synchronizes the AGC
changes to the RAKE receiver and makes sure that the AGC
gain does not change over a symbol period, resulting in more
accurate estimation. Such synchronization can be accomplished
by setting the appropriate bits of the AGC control register.
When the channel comes out of sleep, it loads the AGC holdoff
counter value and starts counting down, clocked by the Master
clock. When this counter reaches zero, the CIC filter of the
AGC starts decimation and updates the AGC loop filter based
on the set CIC decimation value.
Further, whenever the user wants to synchronize the start of
decimation for a new update sample, an appropriate holdoff
value can be set in the AGC Holdoff counter (0x0B, 0x13) and
then the Sync now bit (Bit 3) in the AGC control word is set.
Upon setting this bit, the holdoff counter value is counted down
and a CIC decimated value is updated on the count of zero.
Along with updating a new value, the CIC filter accumulator
can be reset if Init on Sync bit (Bit 2) of the AGC control word
is set. Each sync will initiate a new sync signal unless first sync
only bit (Bit 1) of the AGC control word is set. If this bit is not
set, again the holdoff counter is loaded with the value in the
Holdoff register to count down and repeat the same process.
These additional features make the AGC synchronization more
flexible and applicable to varied circumstances.
Addresses 0x0A–0x11 have been reserved for configuring AGC
A, and addresses 0x12–0x19 have been reserved for configuring
AGC B. The register specifications are detailed in the Memory
Map for Output Port Control Registers section.
USER-CONFIGURABLE BUILT-IN SELF TEST (BIST)
The AD6635 includes two built-in test features to test the integ-
rity of each channel. The first is a RAM BIST and is intended
to test the integrity of the high speed random access memory
within the AD6635. The second is Channel BIST, which is
designed to test the integrity of the main signal paths of the
AD6635. Each BIST function is independent of the other,
meaning that each channel can be tested independently at the
same time.
RAM BIST
The RAM BIST can be used to validate functionality of the
on-chip RAM. This feature provides a simple pass/fail test,
which will give confidence that the channel RAM is operational.
The following steps should be followed to perform this test.
1. The channels to be tested should be put into Sleep mode via
the external address register 0x011.
2. The RAM BIST Enable bit in the RCF register 0xA8
should be set high.
3. Wait 1600 clock cycles.
4. Register 0xA8 should be read back. If Bit 0 is high, the test
is not yet complete. If Bit 0 is low, the test is complete and
Bits 1 and 2 indicate the condition of the internal ram. If
Bit 1 is high, then CMEM is bad. If Bit 2 is high, then
DMEM is bad.
Table VIII. BIST Register 0xA8
0xA8
Coefficient MEM
Data MEM
XX1
000
010
100
110
Test incomplete
PASS
FAIL
PASS
FAIL
Test incomplete
PASS
PASS
FAIL
FAIL
Channel BIST
The Channel BIST is a thorough test of the selected AD6635
signal path. With this test mode, it is possible to use externally
supplied vectors or an internal pseudorandom generator. An
error signature register in the RCF monitors the output data of
the channel, and is used to determine whether the proper data
exits the RCF. If errors are detected, each internal block may be
bypassed and another test can be run to debug the fault. The I
and Q paths are tested independently. The following steps
should be followed to perform this test.
1. The channels to be tested should be configured as required
for the application, setting the decimation rates, scalars,
and RCF coefficients.
2. The channels should remain in the Sleep mode.
3. The Start Holdoff counter of the channels to be tested
should be set to 1.
4. Memory locations 0xA5 and 0xA6 should be set to 0.
5. The Channel BIST located at 0xA7 should be enabled by
setting Bits 19–0 to the number of RCF outputs to observe.
6. Bit 4 of External Address Register 5 should be set high to
start the soft sync.
7. Set the SYNC bits high for the channels to be tested.
8.
Bit 6 must be set to 0 to allow the user to provide test
vectors. The internal pseudorandom number generator
may also be used to generate an input sequence by setting
Bit 7 high.
9. An internal full-scale sine wave can be inserted when Bit 6
is set to 1 and Bit 7 is cleared.
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