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| 型號(hào)： | MT47H128M8HV-187ELIT:E |
| 元件分類： | DRAM |
| 英文描述： | 128M X 8 DDR DRAM, 0.35 ns, PBGA60 |
| 封裝： | 8 X 11.50 MM, FBGA-60 |
| 文件頁(yè)數(shù)： | 50/133頁(yè) |
| 文件大?。?/td> | 9170K |
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Electrical Specifications – Absolute Ratings
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other condi-
tions outside those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may
affect reliability.
Table 5: Absolute Maximum DC Ratings
Parameter
Symbol
Min
Max
Units
Notes
VDD supply voltage relative to VSS
VDD
–1.0
2.3
V
VDDQ supply voltage relative to VSSQ
VDDQ
–0.5
2.3
V
VDDL supply voltage relative to VSSL
VDDL
–0.5
2.3
V
Voltage on any ball relative to VSS
VIN, VOUT
–0.5
2.3
V
Input leakage current; any input 0V
≤ VIN ≤ VDD; all other
balls not under test = 0V
II
–5
5
A
Output leakage current; 0V
≤ VOUT ≤ VDDQ; DQ and ODT dis-
abled
IOZ
–5
5
A
VREF leakage current; VREF = Valid VREF level
IVREF
–2
2
A
Notes: 1. VDD, VDDQ, and VDDL must be within 300mV of each other at all times; this is not re-
quired when power is ramping down.
2. VREF ≤ 0.6 × VDDQ; however, VREF may be ≥ VDDQ provided that VREF ≤ 300mV.
3. Voltage on any I/O may not exceed voltage on VDDQ.
Temperature and Thermal Impedance
It is imperative that the DDR2 SDRAM device’s temperature specifications, shown in
Table 6 (page 24), be maintained in order to ensure the junction temperature is in the
proper operating range to meet data sheet specifications. An important step in maintain-
ing the proper junction temperature is using the device’s thermal impedances correct-
ly. The thermal impedances are listed in Table 7 (page 25) for the applicable and
available die revision and packages.
Incorrectly using thermal impedances can produce significant errors. Read Micron tech-
nical note TN-00-08, “Thermal Applications” prior to using the thermal impedances
listed in Table 7. For designs that are expected to last several years and require the flexi-
bility to use several DRAM die shrinks, consider using final target theta values (rather
than existing values) to account for increased thermal impedances from the die size re-
duction.
The DDR2 SDRAM device’s safe junction temperature range can be maintained when
the TC specification is not exceeded. In applications where the device’s ambient temper-
ature is too high, use of forced air and/or heat sinks may be required in order to satisfy
the case temperature specifications.
1Gb: x4, x8, x16 DDR2 SDRAM
Electrical Specifications – Absolute Ratings
PDF: 09005aef821ae8bf
1GbDDR2.pdf – Rev. S 10/09 EN
23
Micron Technology, Inc. reserves the right to change products or specifications without notice.
2004 Micron Technology, Inc. All rights reserved.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MT47H128M8HV-25AT | 制造商:MICRON 制造商全稱:Micron Technology 功能描述:DDR2 SDRAM |
| MT47H128M8HV-25EAT | 制造商:MICRON 制造商全稱:Micron Technology 功能描述:DDR2 SDRAM |
| MT47H128M8HV-25EIT | 制造商:MICRON 制造商全稱:Micron Technology 功能描述:DDR2 SDRAM |
| MT47H128M8HV-25EL | 制造商:MICRON 制造商全稱:Micron Technology 功能描述:DDR2 SDRAM |
| MT47H128M8HV-25IT | 制造商:MICRON 制造商全稱:Micron Technology 功能描述:DDR2 SDRAM |
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