參數(shù)資料
型號: 28F001BX
廠商: Intel Corp.
英文描述: 5 V Boot Block Flash Memory(5 V引導(dǎo)塊閃速存儲器)
中文描述: 5伏啟動塊閃存(5伏引導(dǎo)塊閃速存儲器)
文件頁數(shù): 28/39頁
文件大小: 648K
代理商: 28F001BX
28F001BX
E
28
Output
0.8
Test Points
Input
2.0
2.0
0.8
2.4
0.45
AC test inputs are driven at V
(2.4 V
) for a Logic "1" and V
(0.45 V
) for a Logic "0." Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10% to 90%) <10 ns.
Figure 11. AC Input/Output Reference Waveform
Device
Under Test
Out
R
L
= 3.3 k
1N914
1.3V
C
L
= 100 pF
NOTE:
C
L
Includes Jig Capacitance
Figure 12. Standard Test Configuration
AC Testing Load Circuit
Device
Under Test
Out
R
L
= 3.3 k
1N914
1.3V
C
L
= 30 pF
NOTE:
C
L
Includes Jig Capacitance
Figure 13. High Speed Test Configuration
AC Testing Load Circuit
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