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| 型號(hào)： | IBM21P100BGC |
| 元件分類(lèi)： | 總線(xiàn)控制器 |
| 英文描述： | PCI BUS CONTROLLER, PBGA304 |
| 封裝： | 31 X 31 MM, PLASTIC, BGA-304 |
| 文件頁(yè)數(shù)： | 32/144頁(yè) |
| 文件大小： | 5197K |
| 代理商： | IBM21P100BGC |
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IBM21P100BGC
IBM 133 PCI-X Bridge R2.0
ppb20_jtag.fm.01
October 15, 2001
JTAG Boundary Scan
Page 127 of 144
9.5.1 Boundary-Scan Register Bit Map
Table 9-2 gives the mapping between the bit position in the boundary-scan register and the signal or control
function that it represents. The index is ordered from JTG_TDO to JTG_TDI. The value on JTG_TDI is
applied on the rising edge of JTG_TCK, and JTG_TDO is valid on the falling edge of JTG_TCK. The
JTG_TDO driver is enabled by the TAP controller, all other tristate drivers are controlled by the boundary-
scan register control cells listed in the
Table 9-2, and by the HIGHZ instruction code.
Output-only pins:
For device outputs that are not shared with component test functions, the
boundary-scan cell IBM1149_BSR_BIDIOUT is used. Outputs that are shared with
component test inputs use the IBM1149_BSR_OUT boundary-scan cell. Those
that are shared with component test outputs use the IBM1149_BSR_TESTOUT
boundary-scan cell. The BSDL function label of OUTPUT2 is used for two-state
outputs, OUTPUT3 is used for three-state outputs.
Bidirectional pins:
For bidirectional device pins that are not shared with component test outputs, the
boundary-scan cell IBM1149_BSR_BIDI is used. Bidirectional pins that are shared
with component test inputs use the IBM1149_BSR_BIDI_SIO boundary-scan cell.
Those that are shared with component test outputs use the
IBM1149_BSR_BIDITESTOUT boundary-scan cell. All have the BSDL function
label of BIDIR.
Control Functions:
Two different boundary-scan cells are used to control the device’s driver enables,
these are IBM1149_BSR_ENAB and IBM1149_BSR_FASTENAB. While they
perform the same boundary-scan function, they differ in that the
IBM1149_BSR_FASTENAB cell has a faster functional path through it. It is often
used on timing-critical signals. Both have the BSDL function label of CONTROL.
Table 9-2. Boundary-Scan Register Bit Map (Page 1 of 12)
Bit Position
Cell Type
Port Name
Function
Tristate
Control Cell
1
IBM1149_BSR_BIDI
P_AD(0)
BIDIR
209
2
IBM1149_BSR_BIDI
P_AD(1)
BIDIR
210
3
IBM1149_BSR_BIDI
P_AD(2)
BIDIR
211
4
IBM1149_BSR_BIDI
P_AD(3)
BIDIR
212
5
IBM1149_BSR_BIDI
P_AD(4)
BIDIR
213
6
IBM1149_BSR_BIDI
P_AD(5)
BIDIR
214
7
IBM1149_BSR_BIDI
P_AD(6)
BIDIR
215
8
IBM1149_BSR_BIDI
P_AD(7)
BIDIR
216
9
IBM1149_BSR_BIDI
P_AD(8)
BIDIR
217
10
IBM1149_BSR_BIDI
P_AD(9)
BIDIR
218
11
IBM1149_BSR_BIDI
P_AD(10)
BIDIR
219
12
IBM1149_BSR_BIDI
P_AD(11)
BIDIR
220
13
IBM1149_BSR_BIDI
P_AD(12)
BIDIR
221
14
IBM1149_BSR_BIDI
P_AD(13)
BIDIR
222
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