參數(shù)資料
型號: MFRC53001T
廠商: NXP Semiconductors N.V.
元件分類: 通信及網(wǎng)絡(luò)
英文描述: ISO-IEC 14443 A Reader IC
封裝: MFRC53001T/0FE<SOT287-1 (SO32)|<<http://www.nxp.com/packages/SOT287-1.html<1<week 5, 2005,;MFRC53001T/0FE<SOT287-1 (SO32)|<<http://www.nxp.com/packages/SOT287-1.html<1
文件頁數(shù): 101/115頁
文件大小: 2590K
代理商: MFRC53001T
MFRC530_33
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NXP B.V. 2010. All rights reserved.
Product data sheet
PUBLIC
Rev. 3.3 — 6 July 2010
057433
101 of 115
NXP Semiconductors
MFRC530
ISO/IEC 14443 A Reader IC
15.2.2
Analog test signals
The analog test signals can be routed to pin AUX by selecting them using the
TestAnaSelect register TestAnaOutSel[4:0] bits.
Table 168. Analog test signal selection
Value
Signal Name
0
VMID
1
Vbandgap
2
VRxFollI
3
VRxFollQ
4
VRxAmpI
5
VRxAmpQ
6
VCorrNI
(1) RFOut; 1 V per division.
(2) MFOUTSelect[2:0] = 4; Manchester with subcarrier; 2 V per division.
(3) MFOUTSelect[2:0] = 5; Manchester; 2 V per division.
Fig 26. RX control signals
001aak627
10
μ
s per division
(1)
(2)
(3)
Description
voltage at internal node VMID
internal reference voltage generated by the bandgap
output signal from the demodulator using the I-clock
output signal from the demodulator using the Q-clock
I-channel subcarrier signal amplified and filtered
Q-channel subcarrier signal amplified and filtered
output signal of N-channel correlator fed by the I-channel subcarrier
signal
output signal of N-channel correlator fed by the Q-channel subcarrier
signal
output signal of D-channel correlator fed by the I-channel subcarrier
signal
output signal of D-channel correlator fed by the Q-channel subcarrier
signal
evaluation signal from the left half-bit
7
VCorrNQ
8
VCorrDI
9
VCorrDQ
A
VEvalL
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