參數(shù)資料
型號: MT48LC32M4A2P-7ELIT:G
元件分類: DRAM
英文描述: 32M X 4 SYNCHRONOUS DRAM, 5.4 ns, PDSO54
封裝: 0.400 INCH, LEAD FREE, PLASTIC, TSOP2-54
文件頁數(shù): 47/74頁
文件大小: 2385K
PDF: 09005aef8091e66d/Source: 09005aef8091e625
Micron Technology, Inc., reserves the right to change products or specifications without notice.
128MSDRAM_2.fm - Rev. N 1/09 EN
51
1999 Micron Technology, Inc. All rights reserved.
128Mb: x4, x8, x16 SDRAM
Notes
1. All voltages referenced to VSS.
2. This parameter is sampled. VDD, VDDQ = +3.3V; f = 1 MHz, TA = 25°C; pin under test
biased at 1.4V.
3. IDD is dependent on output loading and cycle rates. Specified values are obtained
with minimum cycle time and the outputs open.
4. Enables on-chip refresh and address counters.
5. The minimum specifications are used only to indicate cycle time at which proper
operation over the full temperature range (0°C ≤ TA +70°C (commercial), –40°C ≤ TA
+85°C (industrial), and –40°C ≤ TA +105°C (automotive) ) is ensured.
6. An initial pause of 100s is required after power-up, followed by two AUTO REFRESH
commands, before proper device operation is ensured. (VDD and VDDQ must be pow-
ered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO
REFRESH command wake-ups should be repeated any time the tREF refresh require-
ment is exceeded.
7. AC characteristics assume tT = 1ns.
8. In addition to meeting the transition rate specification, the clock and CKE must tran-
sit between VIH and VIL (or between VIL and VIH) in a monotonic manner.
9. Outputs measured at 1.5V with equivalent load:
Q
50pF
10. tHZ defines the time at which the output achieves the open circuit condition; it is not
a reference to VOH or VOL. The last valid data element will meet tOH before going
High-Z.
11. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V
crossover point. If the input transition time is longer than 1 ns, then the timing is ref-
erenced at VIL (MAX) and VIH (MIN) and no longer at the 1.5V crossover point. CLK
should always be 1.5V referenced to crossover. Refer to Micron technical note
TN-48-09 for more details.
DQM to data mask during WRITEs
tDQM
000
tCK
DQM to data High-Z during READs
tDQZ
222
tCK
WRITE command to input data delay
tDWD
000
tCK
Data-in to ACTIVE command
tDAL
5
4
5
tCK
Data-in to PRECHARGE command
tDPL
222
tCK
Last data-in to burst STOP command
tBDL
111
tCK
Last data-in to new READ/WRITE command
tCDL
111
tCK
Last data-in to PRECHARGE command
tRDL
222
tCK
LMR command to ACTIVE or REFRESH command
tMRD
222
tCK
Data-out to High-Z from PRECHARGE command
CL = 3
tROH(3)
333
tCK
CL = 2
tROH(2)
2
tCK
Table 18:
AC Functional Characteristics
Notes: 5, 6, 7, 8, 9, 11; notes appear on page 51
Parameter
Symbol
-6A
-7E
-75
Units
Notes
相關PDF資料
PDF描述
MT55L256L18FT-12TR 256K X 18 ZBT SRAM, 9 ns, PQFP100
MT55L256L32FT-12 256K X 32 ZBT SRAM, 9 ns, PQFP100
MT55L512V18PF-6 512K X 18 ZBT SRAM, 3.5 ns, PBGA165
MT57W4MH9CF-6 4M X 9 DDR SRAM, 0.5 ns, PBGA165
MT58L128L36D1T-5IT 128K X 36 STANDARD SRAM, 2.8 ns, PQFP100
相關代理商/技術參數(shù)
參數(shù)描述
MT48LC32M4A2TG 制造商:MICRON 制造商全稱:Micron Technology 功能描述:SYNCHRONOUS DRAM
MT48LC32M4A2TG-75 制造商:MICRON 制造商全稱:Micron Technology 功能描述:SYNCHRONOUS DRAM
MT48LC32M4A2TG-75IT 制造商:MICRON 制造商全稱:Micron Technology 功能描述:SYNCHRONOUS DRAM