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MPC755 RISC Microprocessor Hardware Specifications
MOTOROLA
System Design Information
Power and ground connections must be made to all external V
DD
, OV
DD
, L2OV
DD
, and GND pins of the
MPC755. Note that power must be supplied to L2OV
DD
even if the L2 interface of the MPC755 will not be
used; it is recommended to connect L2OV
DD
to OV
DD
and L2VSEL to BVSEL if the L2 interface is unused.
(This requirement does not apply to the MPC745 since it has neither an L2 interface nor L2OV
DD
pins.)
1.8.5
Output Buffer DC Impedance
The MPC755 60x and L2 I/O drivers are characterized over process, voltage, and temperature. To measure
Z
0
, an external resistor is connected from the chip pad to (L2)OV
DD
or GND. Then, the value of each
resistor is varied until the pad voltage is (L2)OV
DD
/2 (see Figure 22).
The output impedance is the average of two components, the resistances of the pull-up and pull-down
devices. When data is held low, SW2 is closed (SW1 is open), and R
N
is trimmed until the voltage at the
pad equals (L2)OV
DD
/2. R
N
then becomes the resistance of the pull-down devices. When data is held high,
SW1 is closed (SW2 is open), and R
P
is trimmed until the voltage at the pad equals (L2)OV
DD
/2. R
P
then
becomes the resistance of the pull-up devices.
Figure 22 describes the driver impedance measurement circuit described above.
Figure 22. Driver Impedance Measurement Circuit
Alternately, the following is another method to determine the output impedance of the MPC755. A voltage
source, V
force
, is connected to the output of the MPC755 as shown in Figure 23. Data is held low, the voltage
source is set to a value that is equal to (L2)OV
DD
/2 and the current sourced by V
force
is measured. The
voltage drop across the pull-down device, which is equal to (L2)OV
DD
/2, is divided by the measured current
to determine the output impedance of the pull-down device, R
N
. Similarly, the impedance of the pull-up
device is determined by dividing the voltage drop of the pull-up, (L2)OV
DD
/2, by the current sank by the
pull-up when the data is high and V
force
is equal to (L2)OV
DD
/2. This method can be employed with either
empirical data from a test setup or with data from simulation models, such as IBIS.
R
P
and R
N
are designed to be close to each other in value. Then Z
0
= (R
P
+ R
N
)/2.
Figure 24 describes the alternate driver impedance measurement circuit.
(L2)OV
DD
OGND
R
P
R
N
Pad
Data
SW1
SW2
(L2)OV
DD