參數(shù)資料
型號(hào)： K5A3240YT
廠商： SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述： Multi-Chip Package MEMORY 32M Bit (4Mx8/2Mx16) Dual Bank NOR Flash Memory / 4M(512Kx8/256Kx16) Full CMOS SRAM
中文描述： 多芯片封裝存儲(chǔ)器32兆位（4Mx8/2Mx16）雙銀行NOR閃存/分（512Kx8/256Kx16）全CMOS SRAM的
文件頁(yè)數(shù)： 20/45頁(yè)
文件大?。?/td> 867K
代理商： K5A3240YT
MCP MEMORY
K5A3x40YT(B)C
Revision 0.0
November 2002
- 27 -
Preliminary
DC CHARACTERISTICS(Continued)
NOTES:
1. The ICC current listed includes both the DC operating current and the frequency dependent component(at 5 MHz).
The read current is typically 14 mA (@ VccF=3.0V , OE at VIH.)
2. ICC active during Internal Routine(program or erase) is in progress.
3. ICC active during Read while Write is in progress.
4. The high voltage ( VHH or VID ) must be used in the range of VccF = 3.0V ± 0.3V
5. Not 100% tested.
6. Typical values are measured at VccF = VccS = 3.0V, Ta=25°C , not 100% tested.
Parameter
Symbol
Test Conditions
Min
Typ
Max
Unit
Flash
Automatic Sleep Mode
ISB3
VIH=VccF±0.3V, VIL=VSS±0.3V, OE=VIL, IOL=IOH=0
-
5
18
A
Voltage for WP/ACC Block
Temporarily Unprotect and
Program Acceleration (4)
VHH
VccF = 3.0V ± 0.3V
8.5
-
12.5
V
Voltage for Autoselect and
Block Protect (4)
VID
VccF = 3.0V ± 0.3V
8.5
-
12.5
V
Low VccF Lock-out Voltage (5)
VLKO
1.8
-
2.5
V
SRAM
Operating Current
ICC1
Cycle time=1
s, 100% duty, CS1
S≤0.2,
CS2S≥VccS-0.2V, LB≤0.2V and/or UB≤0.2V
All outputs open, VIN
≤0.2V or VIN≥Vcc
S-0.2V,
BYTES=VccS± 0.3V or Vss± 0.3V
-
3
mA
ICC2
Cycle time=Min, 100% duty, CS1S=VIL, CS2S=VIH,
LB
=VIL and/or UB= VIL, All outputs open, VIN=VIL or
VIH, BYTES=VccS± 0.3V or Vss± 0.3V
-
20
27
mA
Standby Current
ISB
CS1S≥VccS-0.2V, CS2S≥VccS-0.2V (CS1S controlled)
or CS2S≤0.2V (CS2S controlled),
BYTES=VccS± 0.3V or Vss± 0.3V,
Other input =0~VccS
-
0.5
10
A
AC TEST CONDITION
Parameter
Value
Input Pulse Levels
0V to Vcc
Input Rise and Fall Times
5ns
Input and Output Timing Levels
Vcc/2
Output Load
CL = 30pF
CAPACITANCE(TA = 25
°C, Vcc
F = VccS = 3.3V, f = 1.0MHz)
NOTE: Capacitance is periodically sampled and not 100% tested.
Item
Symbol
Test Condition
Min
Max
Unit
Input Capacitance
CIN
VIN=0V
-
18
pF
Output Capacitance
COUT
VOUT=0V
-
20
pF
Control Ball Capacitance
CIN2
VIN=0V
-
18
pF
0V
Vcc
Vcc/2
Input Pulse and Test Point
Input & Output
Test Point
Output Load
* CL= 30pF including Scope
CL
Device
and Jig Capacitance
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