參數(shù)資料
型號： MFRC52301HN1
廠商： NXP Semiconductors N.V.
元件分類： 通信及網(wǎng)絡(luò)
英文描述： Contactless reader IC
封裝： MFRC52301HN1<SOT617-1 (HVQFN32)|<<http://www.nxp.com/packages/SOT617-1.html<1<Always Pb-free,;MFRC52301HN1<SOT617-1 (HVQFN32)|<<http://www.nxp.com/packages/SOT617-1.html&
文件頁數(shù)： 81/98頁
文件大?。?/td> 1666K
代理商： MFRC52301HN1
MFRC523
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.7 — 8 November 2011
115237
81 of 98
NXP Semiconductors
MFRC523
Contactless reader IC
Table 158. Test bus signals: TestBusSel[4:0] = 0Dh
Pins
Internal test
signal name
D6
clkstable
D5
clk27/8
D4 to D3
-
D2
clk27
D1
-
16.1.3
Test signals on pins AUX1 or AUX2
The MFRC523 allows the user to select internal signals for measurement on pins AUX1 or
AUX2. These measurements can be helpful during the design-in phase to optimize the
design or used for test purposes.
Table 159
shows the signals that can be switched to pin AUX1 or AUX2 by setting
AnalogSelAux1[3:0] or AnalogSelAux2[3:0] in the AnalogTestReg register.
Remark:
The DAC has a current output, therefore it is recommended that a 1 k
pull-down resistor is connected to pin AUX1 or pin AUX2.
Table 159. Test signal descriptions
AnalogSelAuxn[3:0] Signal on pin AUXn
0000
16.1.3.1
Example: Output test signals TestDAC1 and TestDAC2
The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal
TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of
TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg
registers.
Figure 28
shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the
TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the
TestDAC2Reg register is programmed with a rectangular signal defined by values 00h
and 3Fh.
Description
oscillator output signal
oscillator output signal divided by 8
reserved
oscillator output signal
reserved
3-state
0001
0010
0011
0100
0101
0110
0111 to 1001
1010
1011
1100
1101
1110
1111
DAC: register TestDAC1 or TestDAC2
DAC: test signal Corr1
reserved
DAC: test signal MinLevel
DAC: test signal ADC_I
DAC: test signal ADC_Q
reserved
HIGH
LOW
TxActive
RxActive
subcarrier detected
TstBusBit
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