參數(shù)資料
型號(hào): PERICOMPI7C8150
廠商: Pericom Semiconductor Corp.
英文描述: 2-Port PCI-to-PCI Bridge
中文描述: 2端口PCI至PCI橋
文件頁(yè)數(shù): 95/106頁(yè)
文件大?。?/td> 904K
代理商: PERICOMPI7C8150
PI7C8150
2-PORT PCI-TO-PCI BRIDGE
ADVANCE INFORMATION
85
August 22, 2002 – Revision 1.02
Upon activation of the TRST_L reset pin, the latched instruction asynchronously changes
to the id code instruction. When the TAP controller moves into the test state other than by
reset activation, the opcode changes as TDI shifts, and becomes active on the falling edge
of TCK.
16.2
BOUNDARY SCAN INSTRUCTION SET
The PI7C8150 supports three mandatory boundary-scan instructions (BYPASS, SAMPLE
and EXTEST). The table shown below lists the PI7C8150’s boundary-scan instruction
codes.
Table 16-1. TAP Pins
Instruction
Requisite
EXTEST
IEEE 1149.1
Required
/
Opcode (binary)
Description
00000
EXTEST initiates testing of external circuitry, typically board-
level interconnects and off chip circuitry. EXTEST connects the
boundary-scan register between TDI and TDO. When EXTEST
is selected, all output signal pin values are driven by values
shifted into the boundary-scan register and may change only of
the falling edge of TCK. Also, when EXTEST is selected, all
system input pin states must be loaded into the boundary-scan
register on the rising-edge of TCK.
SAMPLE performs two functions:
A snapshot of the sample instruction is captured on the
rising edge of TCK without interfering with normal
operation. The instruction causes boundary-scan register
cells associated with outputs to sample the value being
driven.
On the falling edge of TCK, the data held in the boundary-
scan cells is transferred to the slave register cells.
Typically, the slave latched data is applied to the system
outputs via the EXTEST instruction.
Enable internal SCAN test
CLAMP instruction allows the state of the signals driven from
component pins to be determined from the boundary-scan
register while the bypass register is selected as the serial path
between TDI and TDO. The signal driven from the component
pins will not change while the CLAMP instruction is selected.
BYPASS instruction selects the one-bit bypass register between
TDI and TDO pins. 0 (binary) is the only instruction that
accesses the bypass register. While this instruction is in effect,
all other test data registers have no effect on system operation.
Test data registers with both test and system functionality
performs their system functions when this instruction is selected.
SAMPLE
IEEE 1149.1
Required
0001
INTSCAN
CLAMP
00010
00100
BYPASS
11111
16.3
TAP TEST DATA REGISTERS
The PI7C8150 contains two test data registers (bypass and boundary-scan). Each test data
register selected by the TAP controller is connected serially between TDI and TDO. TDI is
connected to the test data register’s most significant bit. TDO is connected to the least
significant bit. Data is shifted one bit position within the register towards TDO on each
rising edge of TCK. While any register is selected, data is transferred from TDI to TDO
without inversion. The following sections describe each of the test data registers.
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