參數(shù)資料
型號(hào)： T8102A
英文描述： H.100/H.110 Interface and Time-Slot Interchangers
中文描述： H.100/H.110接口和時(shí)隙Interchangers
文件頁數(shù)： 68/112頁
文件大?。?/td> 1408K
代理商： T8102A
64
Lucent Technologies Inc.
Advance Data Sheet
November 1999
H.100/H.110 Interfaces and Time-Slot Interchangers
Ambassador T8100A, T8102, and T8105
2 Architecture and Functional Description
(continued)
2.8 The JTAG Test Access Port
2.8.1 Overview of the JTAG Architecture
Tap
A 5-pin test access port, consisting of input pins TCK, TMS, TDI, TDO,
and TRST, provides the standard interface to the test logic. TRST is an
active-low signal that resets the circuit.
TAP Controller
The TAP controller implements the finite state machine which controls the
operation of the test logic as defined by the standard. The TMS input
value sampled on the rising edge of TCK controls the state transitions.
The state diagram underlying the TAP controller is shown below.
Instruction Register (JIR)
A 3-bit scannable JTAG instruction register that communicates data or
commands between the TAP and the devices during test or HDS opera-
tions.
Boundary-Scan Register (JBSR)
A 211-bit JTAG boundary-scan register containing one scannable register
cell for every I/O pin and every 3-state enable signal of the device, as
defined by the standard. JBSR can capture from parallel inputs or update
into parallel outputs for every cell in the scan path. JBSR may be config-
ured into three standard modes of operation (EXTEST, INTEST, and
SAMPLE) by scanning the proper instruction code into the instruction reg-
ister (JIR). An in-depth treatment of the boundary-scan register, its physi-
cal structure, and its different cell types is given in Table 62.
Bypass Register (JBPR)
A 1-bit long JTAG bypass register to bypass the boundary-scan path of
nontargeted devices in board environments as defined by the standard.
2.8.2 Overview of the JTAG Instructions
The JTAG block supports the public instructions as shown in the table below.
Table 61. JTAG Instruction Set
Instruction Mnemonics
EXTEST
SAMPLE
Reserved
Reserved
Reserved
Reserved
Reserved
BYPASS
Instruction Codes
000
001
010
011
100
101
110
111
Public/Private
Public
Public
—
—
—
—
—
Public
Description
Select B-S register in extest mode
Select B-S register in sample mode
—
—
—
—
—
Select BYPASS register
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
T810-400B 制造商:STMICROELECTRONICS 制造商全稱:STMicroelectronics 功能描述:HIGH PERFORMANCE TRIACS
T8105A 制造商:AGERE 制造商全稱:AGERE 功能描述:H.100/H.110 Interface and Time-Slot Interchangers
T810-600B 功能描述:雙向可控硅 8A TRIACS RoHS:否 制造商:STMicroelectronics 開啟狀態(tài) RMS 電流 (It RMS):16 A 不重復(fù)通態(tài)電流:120 A 額定重復(fù)關(guān)閉狀態(tài)電壓 VDRM:600 V 關(guān)閉狀態(tài)漏泄電流（在 VDRM IDRM 下）:5 uA 開啟狀態(tài)電壓: 保持電流（Ih 最大值）:45 mA 柵觸發(fā)電壓 (Vgt):1.3 V 柵觸發(fā)電流 (Igt):1.75 mA 最大工作溫度: 安裝風(fēng)格:Through Hole 封裝 / 箱體:TO-220AB
T810-600B 制造商:STMicroelectronics 功能描述:TRIAC 8A 600V D-PAK
T810-600B-TR 功能描述:雙向可控硅 8A TRIACS RoHS:否 制造商:STMicroelectronics 開啟狀態(tài) RMS 電流 (It RMS):16 A 不重復(fù)通態(tài)電流:120 A 額定重復(fù)關(guān)閉狀態(tài)電壓 VDRM:600 V 關(guān)閉狀態(tài)漏泄電流（在 VDRM IDRM 下）:5 uA 開啟狀態(tài)電壓: 保持電流（Ih 最大值）:45 mA 柵觸發(fā)電壓 (Vgt):1.3 V 柵觸發(fā)電流 (Igt):1.75 mA 最大工作溫度: 安裝風(fēng)格:Through Hole 封裝 / 箱體:TO-220AB
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