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參數(shù)資料
| 型號(hào)： | TMPR28051 |
| 英文描述： | TMPR28051 STS-1/AU-3 (STM-0) Mapper Device Advisory for Version 5 of the Device |
| 中文描述： | TMPR28051 STS-1/AU-3（的STM - 0）映射為版本的設(shè)備5設(shè)備咨詢(xún) |
| 文件頁(yè)數(shù)： | 87/90頁(yè) |
| 文件大?。?/td> | 1090K |
| 代理商： | TMPR28051 |
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Data Sheet
August 1999
TMPR28051 STS-1/AU-3 (STM-0) Mapper
73
Lucent Technologies Inc.
Typical Uses
(continued)
Test Pattern Use—Complete System
The internal test pattern generator can be used in conjunction with DS1 or E1 LIU devices that have built-in loop-
backs (such as the Lucent T7698FL3/T7693) to do a complete system test, as shown in Figure 18.
5-4879(F)r.7
Figure 18. Test Pattern Usage for Complete System
Test Pattern Use—End to End
The internal test pattern generator can be used to test connectivity within a link by setting up a test pattern inser-
tion at one end and a drop at the other, as shown in Figure 19.
5-4880(F)r.7
Figure 19. Test Pattern Usage for End-to-End Operation
LIU
TEST
PATTERN
INSERT
TEST
PATTERN
DROP
LIU
TEST
PATTERN
DROP
LOOPBACK
MODE
TEST PATTERN SOURCE
LOOPBACK
MODE
OPTIONAL TEST PATTERN DROP
DS1/E1 IN
DS1/E1 AIS
DS1/E1 AIS
DS1/E1 IN
TMPR28051
MAPPER
TMPR28051
MAPPER
TMPR28051
MAPPER
TEST
PATTERN
INSERT
TEST
PATTERN
DROP
TEST PATTERN SOURCE
TEST PATTERN DROP
TMPR28051
MAPPER
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