參數(shù)資料
型號: LXT386
廠商: Intel Corp.
英文描述: QUAD T1/E1/J1 Transceiver
中文描述: 四T1/E1/J1收發(fā)器
文件頁數(shù): 56/78頁
文件大?。?/td> 500K
代理商: LXT386
LXT386
QUAD T1/E1/J1 Transceiver
56
Datasheet
Data decision threshold
SRE
43
50
57
%
Rel. to peak input voltage
Data slicer threshold
150
mV
Loss of signal threshold
200
mV
LOS hysteresis
50
mV
Consecutive zeros before loss of signal
32
2048
G.775 recommendation
ETSI 300 233 specification
LOS reset
12.5%
1
s density
Low limit
input jitter
tolerance
1
1Hz to 20Hz
20Hz to 2.4kHz
18kHz to 100kHz
36
1.5
0.2
U.I.
U.I.
U.I.
G735 recommendation
Note 1
Cable Attenuation is 6 dB
Differential receiver input impedance
70
k
@1.024 MHz
Input termination resistor tolerance
±1
%
Common mode input impedance to ground
20
k
Input return
loss
51 kHz - 102 kHz
102 - 2048 kHz
2048kHz - 3072 kHz
20
20
20
dB
dB
dB
Measured against nominal
impedance using
components in the LXD384
evaluation board.
LOS delay time
30
μs
Data recovery mode
LOS reset
10
255
marks
Data recovery mode
Receive intrinsic jitter, RCLK output
0.040
0.0625
U.I.
Wide band jitter
Receive
path delay
Bipolar mode
1
U.I.
JA Disabled
Unipolar mode
6
U.I.
Table 39. T1 Transmit Transmission Characteristics
Parameter
Sym
Min
Typ
Max
Unit
Test Condition
Output pulse amplitude
2.4
3.0
3.6
V
Measured at the DSX
Peak voltage of a space
-0.15
+0.15
V
Driver output impedance
1
1
@ 772 KHz
Transmit amplitude variation with power
supply
-1
+1
%
Ratio of positive to negative pulse amplitude
0.95
1.05
T1.102, isolated pulse
Difference between pulse sequences
200
mV
For 17 consecutive
pulses, GR-499-CORE
Pulse width variation at half amplitude
20
ns
Jitter added by
Transmitter
10Hz - 8KHz
8KHz - 40KHz
10Hz - 40KHz
Wide Band
0.020
0.025
0.025
0.050
UI
pk-pk
AT&T Pub 62411
TCLK is jitter free.
1. Guaranteed by design and other correlation methods.
2. Power measured in a 3 KHz bandwidth at the point the signal arrives at the distribution frame for an all 1
s pattern.
Table 38. E1 Receive Transmission Characteristics
(Continued)
Parameter
Sym
Min
Typ
Max
Unit
Test Condition
1. Guaranteed by design and other correlation methods.
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